The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2025

Filed:

Mar. 31, 2023
Applicant:

Toyota Jidosha Kabushiki Kaisha, Toyota, JP;

Inventors:

Yasunori Nakamukai, Nagoya, JP;

Yukiharu Tomita, Toyota, JP;

Kazuhiro Arita, Toyota, JP;

Takahiko Naitou, Nagoya, JP;

Akihito Ito, Inazawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06V 10/764 (2022.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06T 7/0008 (2013.01); G06V 10/764 (2022.01); G06T 2200/04 (2013.01); G06T 2207/10012 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/30164 (2013.01);
Abstract

An inspection device includes a processor configured to calculate a first identification index indicating likelihood of each possible state of an object to be inspected regarding a predetermined inspection item by inputting a color image representing the object into a first classifier, the color image being generated by a camera, calculate a second identification index indicating likelihood of each possible state of the object regarding the predetermined inspection item by inputting a depth image representing, for each pixel, the distance to a part of the object represented in the pixel into a second classifier, the depth image being generated by a 3-D camera, and determine the state of the object regarding the inspection item, based on the result of integration of the first identification index and the second identification index.


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