The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2025
Filed:
Oct. 26, 2022
Applicant:
Konica Minolta, Inc., Tokyo, JP;
Inventor:
Kazuomi Sakatani, Machida, JP;
Assignee:
Konica Minolta Inc., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); H04N 1/00795 (2013.01); G06T 2207/10008 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/30144 (2013.01);
Abstract
An image inspection apparatus includes: a reader that reads an image formed on a recording medium; a first processor that: inspects a first read image including one of divided images obtained by dividing the image at a predetermined position in a main scanning direction, and generates first inspection image data based on an inspection result of the first read image; and a second processor that: inspects a second read image including another of the divided images obtained by dividing the image, and generates second inspection image data based on an inspection result of the second read image.