The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2025

Filed:

Nov. 14, 2022
Applicant:

Pratt & Whitney Canada Corp., Longueuil, CA;

Inventors:

Simon G. Lamarre, Saint-Constant, CA;

Clement Drouin Laberge, Terrebone, CA;

Alain Baron, Carignan, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06F 30/12 (2020.01); G06T 17/20 (2006.01); G06T 19/20 (2011.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06F 30/12 (2020.01); G06T 17/20 (2013.01); G06T 19/20 (2013.01); G06T 2207/20221 (2013.01); G06T 2207/30108 (2013.01); G06T 2219/004 (2013.01); G06T 2219/012 (2013.01); G06T 2219/2004 (2013.01);
Abstract

A method for identifying a geometric feature association for a 3D component model and a 3D manufacturing model is provided. The method includes superimposing the 3D manufacturing model on the 3D component model in a computer-aided drafting (CAD) environment, identifying correspondence between a first geometric feature of the 3D component model and a second geometric feature of the superimposed 3D manufacturing model, measuring at least one distance between the first geometric feature and the second geometric feature, and identifying an association between the first geometric feature and the second geometric feature based on the at least one measured distance.


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