The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2025
Filed:
Jan. 27, 2023
Kikusui Seisakusho Ltd., Kyoto, JP;
Hiroshi Suzuki, Kyoto, JP;
KIKUSUI SEISAKUSHO LTD., kyoto, JP;
Abstract
An exterior inspection device configured to inspect whether or not a molded product in a predetermined shape has defectiveness based on an image of the molded product, the inspection device including: a first foreign matter determiner configured to determine whether or not, in an obtained image of the molded product, a first inspection region located inside an outline of an assumed normal molded product P includes foreign matter; and a second foreign matter determiner configured to determine whether or not, in the obtained image of the molded product, a second inspection region located outside the outline of the assumed normal molded product includes foreign matter.