The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2025

Filed:

Jun. 13, 2025
Applicant:

Guangdong University of Technology, Guangdong, CN;

Inventors:

Liyun Zhong, Guangzhou, CN;

Yuheng Wang, Guangzhou, CN;

Weina Zhang, Guangzhou, CN;

Tao Huang, Guangzhou, CN;

Huiyang Wang, Guangzhou, CN;

Jianglei Di, Guangzhou, CN;

Yuwen Qin, Guangzhou, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/60 (2024.01); G02B 21/36 (2006.01); G06T 5/70 (2024.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 5/60 (2024.01); G02B 21/365 (2013.01); G06T 5/70 (2024.01); G06T 11/00 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/20048 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

The present disclosure of some embodiments provide a phase reconstruction method for differential interference contrast microscopy based on a pix2pix network, the method comprising the following steps: S, constructing an end-to-end deep learning strategy based on the pix2pix network; S, collecting and constructing dataset; S, Training the pix2pix network; S, analyzing network accuracy and convergence, and recording error curves of the datasets; S, analyzing network performance based on error curves of the training set and the test set; S, performing quantitative phase reconstruction for differential interference contrast microscopy using the trained pix2pix network.


Find Patent Forward Citations

Loading…