The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2025

Filed:

May. 02, 2019
Applicant:

Sentek Systems Llc, Minneapolis, MN (US);

Inventors:

Bryan T. Poling, Minneapolis, MN (US);

Theodore C. Poling, Eden Prairie, MN (US);

Assignee:

SENTEK SYSTEMS LLC, Minneapolis, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 50/02 (2024.01); A01C 21/00 (2006.01); G06Q 10/04 (2023.01); G06Q 10/0631 (2023.01);
U.S. Cl.
CPC ...
G06Q 50/02 (2013.01); A01C 21/007 (2013.01); G06Q 10/04 (2013.01); G06Q 10/0631 (2013.01);
Abstract

A sensing-based process for managing nutrient fertilization in crops. This invention uses reference plots in a field, fertilized at different pre-plant rates, including at least one plot fertilized at a lower rate than the majority of the field. Measurements from the plots are used to estimate the Current Limiting Rate (CLR), which is the lowest non-limiting nutrient rate at the time of sensing. Preferred embodiments are presented specifically for managing nitrogen in rain-fed and irrigated corn. These embodiments use the CLR, along with a model for CLR movement with time to determine nutrient rates for mid-season treatments that achieve specified yield-based or profit-based objectives. This invention's novel use of low-rate reference plots to estimate the CLR enable the detection of stress before the main area of a field is impacted, allowing for advance planning and intervention without sacrificing yield potential.


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