The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2025

Filed:

Aug. 31, 2021
Applicant:

Oracle International Corporation, Redwood Shores, CA (US);

Inventors:

James Charles Rohrkemper, Harbor Springs, MI (US);

Richard Paul Sonderegger, Dorchester, MA (US);

Anna Chystiakova, Sunnyvale, CA (US);

Kenneth Paul Baclawski, Waltham, MA (US);

Dieter Gawlick, Palo Alto, CA (US);

Kenny C. Gross, Escondido, CA (US);

Zhen Hua Liu, San Mateo, CA (US);

Guang Chao Wang, San Diego, CA (US);

Assignee:

Oracle International Corporation, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/242 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/242 (2019.01);
Abstract

Techniques for identifying a root cause of an operational result of a deterministic machine learning model are disclosed. A system applies a deterministic machine learning model to a set of data to generate an operational result, such as a prediction of a 'fault' or “no-fault” in the system. The set of data includes signals from multiple different data sources, such as sensors. The system applies an abductive model, generated based on the deterministic machine learning model, to the operational result. The abductive model identifies a particular set of data sources that is associated with the root cause of the operational result. The system generates a human-understandable explanation for the operational result based on the identified root cause.


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Rohrkemper, James. (2025). Root cause analysis for deterministic machine learning model (U.S. Patent No. 12450519). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12450519

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