The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2025
Filed:
Jan. 22, 2024
Rubrik, Inc., Palo Alto, CA (US);
Manjunath Chinni, Saratoga, CA (US);
Sai Kiran Katuri, Santa Clara, CA (US);
Swapnil Bawaskar, Seattle, WA (US);
Manjunatha Devegowda, San Jose, CA (US);
James Irvin, Palo Alto, CA (US);
Van Hoang Thuy Nguyen, Danville, CA (US);
Kamna Jain, Portland, OR (US);
Rubrik, Inc., Palo Alto, CA (US);
Abstract
Methods, systems, and devices for data management are described. One or more requests to apply data observation to one or more data sources may be received via an interface. Whether snapshots are supported for the one or more data sources may be determined. A first, snapshot-supported data source may be stored at a first data storage as a snapshot and a representation of the second, snapshot-unsupported data source may be stored at a second data storage. First data may be extracted from the snapshot and second data may be extracted from the representation of the second data source such that a first data observation procedure may be applied to the first data and a second data observation procedure may be applied to the second data. Results of the data observation procedures may be reported via an interface.