The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2025

Filed:

Aug. 25, 2022
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventors:

Ken Kobayashi, Setagaya, JP;

Yuhei Umeda, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 18/211 (2023.01); G06F 18/2113 (2023.01); G06F 18/214 (2023.01); G06F 18/22 (2023.01); G06F 18/40 (2023.01);
U.S. Cl.
CPC ...
G06F 18/2113 (2023.01); G06F 18/2155 (2023.01); G06F 18/22 (2023.01); G06F 18/40 (2023.01);
Abstract

A storage medium storing a training processing program that causes at least one computer to execute a process that includes acquiring a deviation degree of a feature in a training dataset, by using a determination model, the training dataset being unlabeled; selecting one or more pieces of data included in the training dataset based on the deviation degree; outputting the selected one or more pieces of data or related data related to the selected one or more pieces of data; receiving an input of a determination result by a user for the one or more pieces of data; and determining an adjustment standard used to adjust a feature of each piece of the data included in the training dataset based on the received determination result, wherein when determination target data is determined by the determination model, a feature of the determination target data is adjusted based on the adjustment standard.


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