The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2025

Filed:

May. 30, 2022
Applicant:

Leica Microsystems Cms Gmbh, Wetzlar, DE;

Inventors:

Arnold Mueller-Rentz, Brechen, DE;

Christian Schumann, Lich, DE;

Sebastian Hitzler, Hohenahr-Erda, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/14 (2006.01); G02B 21/02 (2006.01); G02B 21/08 (2006.01); G02B 21/24 (2006.01);
U.S. Cl.
CPC ...
G02B 21/14 (2013.01); G02B 21/02 (2013.01); G02B 21/086 (2013.01); G02B 21/241 (2013.01);
Abstract

A microscope for imaging a sample by a transmitted light contrasting method includes an objective lens holder configured to place an objective lens of a number of objective lenses onto an optical axis of the microscope. The microscope further includes a lens system for forming an intermediate image of an exit pupil of any one of the number of objective lenses placed onto the optical axis. The intermediate image is formed at a respective conjugated plane conjugate to the exit pupil. The microscope further includes a control device configured for automatically positioning a modulation element onto the optical axis at a positon related to the respective conjugated plane.


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