The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2025
Filed:
Aug. 04, 2021
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Stefan Christ, Wetzlar, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
An inverted microscope is provided, the inverted microscope including a microscope stage which includes an opening prepared for transmitted light illumination and which is designed to receive a sample holder and an imaging optical unit arranged below the microscope stage. A closed lower incubation space which surrounds at least the imaging optical unit is arranged adjacent to a lower side of the microscope stage. The inverted microscope is configured such that a temperature in the lower incubation space is adjustable to a specifiable target temperature, for the purposes of which at least one temperature sensor is arranged in the lower incubation space, the measurement signal of the at least one temperature sensor serving to set the specifiable target temperature.