The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2025

Filed:

Mar. 31, 2020
Applicant:

Leica Microsystems Cms Gmbh, Wetzlar, DE;

Inventor:

Christian Schumann, Lich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0032 (2013.01); G02B 21/0044 (2013.01); G02B 21/008 (2013.01);
Abstract

A light sheet microscope includes a light source configured to emit illumination light, an optical system configured to form a light sheet from the illumination light in a sample space, the light sheet being focused in a thickness direction perpendicular to a light propagation direction thereof to form a beam waist in the thickness direction, wherein the optical system has a field diaphragm adjustable to vary a width of the light sheet in a width direction, a scanning element configured to move the light sheet a scanning distance in the sample space along a scanning direction, and a control unit configured to control the field diaphragm for adjusting the width of the light sheet and to control the scanning element for moving the light sheet by the scanning distance to manipulate a target area of a sample by scanning the target area with the beam waist.


Find Patent Forward Citations

Loading…