The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2025
Filed:
Sep. 22, 2021
Applicant:
Topcon Corporation, Tokyo-to, JP;
Inventor:
Shugo Akiyama, Tokyo-to, JP;
Assignee:
TOPCON CORPORATION, Tokyo-to, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/89 (2020.01); A01C 15/00 (2006.01); G01N 21/55 (2014.01); G01S 7/48 (2006.01); G01S 7/481 (2006.01); G01S 7/487 (2006.01);
U.S. Cl.
CPC ...
G01S 17/89 (2013.01); A01C 15/005 (2013.01); G01N 21/55 (2013.01); G01S 7/4817 (2013.01); G01S 7/4876 (2013.01);
Abstract
A scan using a pulsed distance measuring light with two wavelengths of which reflectances are different with respect to a content of a nitrogen by a laser scanner, the two wavelengths are separated, lights are received, a distance measurement value and a light amount are detected for each pulsed distance measuring light and for each of the two wavelengths, a height of a crop is detected based on the distance measurement value, a received light amount ratio of the two wavelengths is detected, and a growth condition of the crop is detected based on the detected height and the received light amount ratio.