The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2025

Filed:

Jan. 30, 2024
Applicant:

GE Precision Healthcare Llc, Waukesha, WI (US);

Inventors:

Tim Sprenger, Bavaria, DE;

Suchandrima Banerjee, Menlo Park, CA (US);

Assignee:

GE PRECISION HEALTHCARE LLC, Waukesha, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/56 (2006.01); G01R 33/385 (2006.01); G01R 33/48 (2006.01); G01R 33/50 (2006.01);
U.S. Cl.
CPC ...
G01R 33/5608 (2013.01); G01R 33/385 (2013.01); G01R 33/4818 (2013.01); G01R 33/50 (2013.01);
Abstract

Systems and methods are provided for a slice-ahead inversion sequence for jointly acquiring non-inverted and inverted contrast. In one example, a method for a magnetic resonance imaging (MRI) system includes acquiring k-space data with the MRI system according to a slice-ahead inversion sequence that jointly generates a contrast without inversion preparation and one or more inversion contrasts for a plurality of slices in a scan volume of a subject, wherein the k-space data comprises first k-space data of the contrast without inversion preparation acquired during one or more non-inversion repetitions and second k-space data of the one or more inversion contrasts acquired during one or more inversion repetitions, wherein a repetition time for each of the one or more non-inversion repetitions and one or more inversion repetitions is constant, and reconstructing one or more images from the k-space data.


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