The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2025

Filed:

Jan. 24, 2022
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Miha Fuderer, Bunnik, NL;

Jacques Den Boer, Son, NL;

Filips Van Liere, Best, NL;

Assignee:

Koninklijke Philips N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/56 (2006.01); G01R 33/58 (2006.01);
U.S. Cl.
CPC ...
G01R 33/5608 (2013.01); G01R 33/583 (2013.01);
Abstract

A magnetic resonance examination method comprises acquisition of a set of magnetic resonance signals from magnetic spins in an object by way of a receiver antenna, the magnetic resonance signals' signal levels are related to an independent reference level that is independent of the receiver antenna's sensitivity to form a calibrated signal level of the magnetic resonance signals, the calibrated signal levels are recorded in terms of a relative density of ordered transverse spins (DOTS). The independent reference level may be derived from the signal-to-thermal-noise ratio. The calibrated signal level in terms of DOTS in μM/T reflects predominantly a tissue property (of (a voxel of) the patient to be examined) as well as details or characteristics of the acquisition sequence used.


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