The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2025

Filed:

Dec. 29, 2021
Applicant:

Nanya Technology Corporation, New Taipei, TW;

Inventors:

Chung-Wei Huang, Taoyuan, TW;

Wei-Te Shen, Taoyuan, TW;

Chia-Ping Liao, New Taipei, TW;

Kai-Li Liu, Taoyuan, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G05F 1/46 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31721 (2013.01); G05F 1/46 (2013.01);
Abstract

The present application discloses a testing system for integrated circuit device, and signal source and power supplying apparatus. The signal source provides a plurality of supply voltages and a programmable voltage to a plurality of semiconductor chip groups. The signal source includes a power supplying apparatus and a switch set. The power supplying apparatus is configured to generate an additional voltage, a plurality of base voltages, and the programmable voltage. The switch set is disposed between the power supplying apparatus and the plurality of semiconductor chip groups and converts the additional voltage and the plurality of base voltages into the plurality of supply voltages.


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