The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2025

Filed:

Mar. 22, 2024
Applicant:

National Radio Research Agency, Naju-si, KR;

Inventors:

Kang Wook Kim, Gwangju, KR;

Soon Soo Oh, Gwangju, KR;

Young Bae Jung, Daejeon, KR;

Jong Hyuk Lim, Icheon-si, KR;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/10 (2006.01); G01R 29/08 (2006.01); H04B 17/15 (2015.01);
U.S. Cl.
CPC ...
G01R 29/10 (2013.01); G01R 29/0878 (2013.01); G01R 29/0892 (2013.01); H04B 17/15 (2015.01);
Abstract

Disclosed are a system and a method for a high-speed performance measurement. The system includes: a fixing part; a positioner for controlling the rotation of the equipment by controlling the fixing part; a measurement probe; a curved reflective plate for reflecting, in the direction of the measurement probe, an electromagnetic wave radiated by the equipment and transforming the spherical wave of the measurement probe into a plane wave at the position where the equipment is provided; an arc structure including an arc arranged to be adjacent to the fixing part; a probe set including near-filed probes arranged to be spaced predetermined intervals apart from each other on the inner side of the arc; and a control unit, which receives, through a signal analyzer, signal data corresponding to an input signal from some of near-filed probes and the measurement probe.


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