The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2025
Filed:
Jan. 21, 2022
Pilkington Group Limited, Lathom, GB;
Pilkington Group Limited, Lathom, GB;
Abstract
A method of detecting a defect in a sheet of glass includes: (i) directing a converging beam from a source of illumination onto a surface of the sheet of glass to illuminate the defect; (ii) focusing an image capture device onto a first plane to image the defect in the sheet of glass; (iii) capturing a first image of the defect; (iv) carrying out an adjustment step; and (v) capturing a second image of the defect. Each of the first and second images has a respective first portion from the illuminated defect and a respective second portion due to reflection of a portion of the beam from the glass surface. In the first image of the defect the first portion is brighter than the second portion, and in the second image of the defect the first portion is darker than the second portion. An apparatus for carrying out the method is also provided.