logo

For the Inventor, By the Inventor

The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12449373 B1

PDFFull Text
Date of Patent:
Oct. 21, 2025

Filed:

Sep. 15, 2022

Inspection support device, inspection support method, and program

Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventor:

Shuhei Horita, Tokyo, JP;

Assignee:

FUJIFILM Corporation, Tokyo, JP;

Attorney:

Studebaker Brackett PLLC

Primary Examiner:

Gregory A Morse

Assistant Examiner:

Owais Iqbal Memon

Int. Cl.
CPC ...
G06K 9/00 (2022.01); G01N 21/88 (2006.01); G06F 30/20 (2020.01); G06T 7/00 (2017.01); G06T 7/70 (2017.01); G06V 10/24 (2022.01); G06V 10/764 (2022.01); G06V 30/10 (2022.01);
U.S. Cl.
CPC ...
G01N 21/8851 (2013.01); G06F 30/20 (2020.01); G06T 7/0002 (2013.01); G06T 7/70 (2017.01); G06V 10/24 (2022.01); G06V 10/764 (2022.01); G06V 30/10 (2022.01); G01N 2021/8854 (2013.01);
Abstract

In an inspection support device that organizes a captured image including damage to a structure and includes a processor, the processor acquires image data including information regarding a structural drawing of a target structure on a medium, and damage identification information regarding the damage and captured image identification information regarding the captured image of the target structure having the damage that are added by a user on the medium, recognizes the damage identification information through image recognition from the image data, recognizes the captured image identification information through image recognition from the image data, associates the damage identification information corresponding to a predetermined damage and the captured image identification information for the target structure having the predetermined damage, acquires the captured image corresponding to the captured image identification information, and associates the damage identification information and the captured image with each other.

Find Patent Forward Citations

Horita, Shuhei. (2025). Inspection support device, inspection support method, and program (U.S. Patent No. 12449373). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12449373

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…