The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2025
Filed:
May. 27, 2021
Seiko Epson Corporation, Tokyo, JP;
Ryoki Watanabe, Matsumoto, JP;
Hikaru Kurasawa, Shiojiri, JP;
Yoshihiro Oshita, Shiojiri, JP;
Masashi Kanai, Azumino, JP;
SEIKO EPSON CORPORATION, Tokyo, JP;
Abstract
Provided is a determination method that includes obtaining measurement data, selecting one or more second wavelengths from a plurality of first wavelengths including at least one of a plurality of measurement wavelengths to generate a plurality of individuals, by using a genetic algorithm, inputting, to a first model learned to reproduce a correct answer label of a target object, the measurement data of the target object belonging to a remaining group and a second spectroscopic spectrum determined by the second wavelength to discriminate a label of the target object belonging to the remaining group, for each of the plurality of individuals, and determining whether or not to use the second wavelength as the wavelength of the spectroscopic spectrum for discrimination based on a rate at which the label is correctly discriminated.