The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2025
Filed:
May. 22, 2023
Applicant:
Apple Inc., Cupertino, CA (US);
Inventors:
Arthur Y. Zhang, San Jose, CA (US);
Sonca Teng, Santa Clara, CA (US);
Assignee:
Apple Inc., Cupertino, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 21/16 (2006.01); G06T 7/246 (2017.01);
U.S. Cl.
CPC ...
G01C 21/165 (2013.01); G06T 7/248 (2017.01); G06T 2207/30252 (2013.01);
Abstract
Methods and systems for relative inertial measurement may include a user device comprising an inertial measurement device and/or a camera. A second inertial measurement device may be configured to move with a reference frame. One or more processors may receive inertial measurements from the first and second inertial measurement devices and determine movement of the user device relative to the reference frame by comparing the received inertial measurements. Additionally reference objects in a view of a camera may be used to calibrate the determined motion of the user device within the reference frame.