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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12448599 B1

PDFFull Text
Date of Patent:
Oct. 21, 2025

Filed:

Jul. 06, 2022

System for assessing a microbial characteristic within a growing medium and associated methods

Applicant:

Purdue Research Foundation, West Lafayette, IN (US);

Inventors:

Rahim Rahimi, West Lafayette, IN (US);

Jose Waimin, Gilbert, AZ (US);

Assignee:

Purdue Research Foundation, West Lafayette, IN (US);

Attorneys:

Hartman Global IP Law

Gary M. Hartman

Domenica N. S. Hartman

Primary Examiner:

Raul J Rios Russo

Int. Cl.
CPC ...
C12M 1/34 (2006.01); G01N 27/02 (2006.01); G01N 33/00 (2006.01); G01N 33/487 (2006.01);
U.S. Cl.
CPC ...
C12M 41/36 (2013.01); C12M 41/46 (2013.01); G01N 27/02 (2013.01); G01N 33/0031 (2013.01); G01N 33/48735 (2013.01); C12M 41/32 (2013.01);
Abstract

Systems and methods for assessing a microbial characteristic within a growing medium. Such a system assesses one or more microbial characteristics, such as biomass and/or microbial activity, within a growing medium, such as soil. Electrical properties of a microbially degradable material in contact with the growing medium are measured. The measurements are used to determine the microbial characteristic(s) based at least partly on degradation of the microbially degradable material.

Find Patent Forward Citations

Rahimi, Rahim. (2025). System for assessing a microbial characteristic within a growing medium and associated methods (U.S. Patent No. 12448599). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12448599

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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