The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2025
Filed:
Oct. 27, 2022
Wavefront Dynamics, Inc., Albuquerque, NM (US);
Xifeng Xiao, Albuquerque, NM (US);
Daniel R. Neal, Tijeras, NM (US);
Jeff Kolberg, Laguna Beach, CA (US);
Ron Rammage, Tijeras, NM (US);
Phillip Riera, Albuquerque, NM (US);
R. James Copland, Albuquerque, NM (US);
Matthew Haugo, Aliso Viejo, CA (US);
WaveFront Dynamics, Inc., Albuquerque, NM (US);
Abstract
This invention comprises a combined optical wavefront aberrometer and topographer system that is used in conjunction with a contact lens that has a plurality of fiducial marks disposed on the lens. The fiducial marks are located radially inside of the undilated pupil's diameter. The optical imaging capacity of the aberrometer is used to measure and monitor any misalignments of the contact lens's position (XY decentration) and/or rotation. Image analysis algorithms are used to track the positions of the fiducial marks, and, hence, the amount of geometric misalignment of the contact lens can be calculated. The fiducial marks can comprise micro ink spots, or depressions in the surface of the contact lens (e.g., divots, dimples, pits), or other small surface features, including raised bumps, which can help to stabilize motions of the contact lens on the eye.