The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Nov. 18, 2021
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Tomoyuki Aizawa, Yamanashi, JP;

Junichi Tezuka, Yamanashi, JP;

Satoshi Ikai, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05K 5/00 (2025.01); G06F 3/0484 (2022.01);
U.S. Cl.
CPC ...
H05K 5/0018 (2022.08); G06F 3/0484 (2013.01);
Abstract

The present invention addresses the problem of providing a display device with which it is possible to display a location in a machining path at which a step occurs that is large enough to affect machining precision without actual machining, and to be able to accurately and at low cost predict the occurrence of the step in the machining path. The problem can be resolved with a display device with which: time-series data is acquired for the position of a driven body or an electric motor on each axis of a machine tool; machining paths are calculated based on the acquired time-series data for the position of the driven body or electric motor on each axis; based on the calculation result for the machining paths, a height reference plane is set for each machining path; the heights from the reference planes of adjacent machining paths are compared; and the locations on the machining paths in which height differences occur that are greater than or equal to a set threshold value are displayed.


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