The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Apr. 05, 2023
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Tejinder Singh, Kanata, CA;

Davi V. Q. Rodrigues, Lubbock, TX (US);

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 1/00 (2006.01); H04B 7/04 (2017.01); H04W 64/00 (2009.01);
U.S. Cl.
CPC ...
H04W 64/003 (2013.01); H04B 7/04013 (2023.05);
Abstract

The technology described herein is directed towards a calibration procedure for remote estimation of the position and orientation of an intelligent reflective surface. The calibration is based on accurate estimation of the relative distances between each element of an intelligent reflective surface and a transmission-reception point, e.g., radar sensor, wireless access point and/or base station. A multifrequency (e.g., dual-tone) calibration signal is transmitted to selected elements of the intelligent reflective surface, with the returned calibration signals used to determine the distance to each selected element, from which distances to other elements are determined, along with the intelligent reflective surface's orientation. An active backscatter tag that boosts the returned signal improves the distance measurement accuracy. From the data obtained, the phase delays along the path linking a target and any element of the intelligent reflective surface, and the path linking that element and the transmission-reception point can be directly determined.


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