The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2025
Filed:
Dec. 15, 2020
Apple Inc., Cupertino, CA (US);
Jie Cui, Cupertino, CA (US);
Hong He, Cupertino, CA (US);
Dawei Zhang, Cupertino, CA (US);
Chunhai Yao, Beijing, CN;
Chunxuan Ye, San Diego, CA (US);
Haitong Sun, Cupertino, CA (US);
Weidong Yang, San Diego, CA (US);
Wei Zeng, Cupertino, CA (US);
Yuchul Kim, Cupertino, CA (US);
Yushu Zhang, Beijing, CN;
Zhibin Wu, Cupertino, CA (US);
Yang Tang, Cupertino, CA (US);
APPLE INC., Cupertino, CA (US);
Abstract
Methods, systems, and devices for wireless communications are described. SSB based inter-frequency measurements may include configuring a UE to perform inter-frequency measurements without measurement gap within a measurement window, and applying scheduling restrictions to prioritize the inter-frequency measurements over uplink transmissions within the measurement window. The measurement window includes an SMTC window duration. Measurement resource sharing or restriction is described for SSB based inter-frequency measurement objects without measurement gap.