The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Sep. 29, 2021
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventors:

Qinyan Jiang, Beijing, CN;

Guoyu Zhang, Beijing, CN;

Tsuyoshi Shimomura, Kawasaki, JP;

Meiyi Jia, Beijing, CN;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/08 (2009.01); H04W 24/10 (2009.01);
U.S. Cl.
CPC ...
H04W 24/08 (2013.01); H04W 24/10 (2013.01);
Abstract

An SSB-based measurement method and apparatus, in which a first measurement result of a first cell is obtained according to at least one of QCL relationships between SSBs to which the first cell corresponds, an SSB transmission restriction to which the first cell corresponds and a detection result of SSBs of the first cell, and measurement information of the first cell is generated according to the first measurement result of the first cell and reported.


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