The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Aug. 14, 2023
Applicant:

Hewlett Packard Enterprise Development Lp, Spring, TX (US);

Inventors:

Xuguang Jia, Beijing, CN;

Qiang Zhou, Santa Clara, CA (US);

Xiaoyang Fu, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/02 (2009.01); H04W 24/08 (2009.01); H04W 24/10 (2009.01);
U.S. Cl.
CPC ...
H04W 24/02 (2013.01); H04W 24/08 (2013.01); H04W 24/10 (2013.01);
Abstract

A method for scanning enhancement is provided. The method comprises receiving a channel scan request, including a scan channel number, a bandwidth, and a total scan time. The method further comprises determining a number of a plurality of scans based on the total scan time and an individual scan time for an AP. The method further comprises determining a plurality of offset values corresponding to the plurality of scans based on the number of the plurality of scans. In addition, the method further comprises performing off-channel scanning based on the scan channel number, the bandwidth, the number of the plurality of scans, and the plurality of offset values. Implementations of the present disclosure can improve the effect and the efficiency of the scanning process, the performance of the features of the upper layer, and the user experience.


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