The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2025
Filed:
Jun. 03, 2024
Samsung Electronics Co., Ltd., Suwon-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
A method and apparatus for measuring and reporting cross-link interference are provided. The method includes receiving, from a base station (BS), a measurement configuration for the CLI, performing measurement on the configured measurement object based on the measurement configuration for the CLI and transmitting, to the BS, based on a measurement result of at least one of a resource from a plurality of resources for measuring the CLI of the configured measurement object exceeding a threshold, a measurement report for all of the plurality of resources for measuring the CLI of the configured measurement object whose measurement result exceeds the threshold.