The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Aug. 19, 2022
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Vasishta Kidambi, Hyderabad, IN;

Harsh Patel, Mumbai, IN;

Aalok Dyuti Saha, Bangalore, IN;

Subrato Roy, Bangalore, IN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); H02M 1/08 (2006.01);
U.S. Cl.
CPC ...
H02M 1/08 (2013.01); G01R 31/2882 (2013.01);
Abstract

One example includes a testing method that includes connecting a capacitor having a first capacitance to an output terminal of an integrated circuit (IC). The method can also include generating pulse signal responsive to an enable signal provided at at least one input terminal of the IC and providing a drive signal to the output terminal to cause a linearly increasing voltage across the capacitor responsive to the pulse signal. The method can also include measuring a no-load delay. The method can also include measuring the linearly increasing voltage at the output terminal responsive to the drive signal. The method can also include determining a first capacitance charge time for the capacitor responsive to the linearly increasing voltage reaching a threshold and determining a second capacitance charge delay for a second capacitance based on the first capacitance charge time and the no-load delay.


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