The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Mar. 25, 2022
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Jong Soo Baek, Hwaseong-si, KR;

Jin Myoung Lee, Hwaseong-si, KR;

Min Soo Kang, Hwaseong-si, KR;

Hyun Ah Roh, Hwaseong-si, KR;

Bo Young Lee, Hwaseong-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/66 (2006.01); G01N 23/2251 (2018.01); G01R 31/28 (2006.01); H01L 23/528 (2006.01);
U.S. Cl.
CPC ...
H01L 22/34 (2013.01); G01N 23/2251 (2013.01); G01R 31/2884 (2013.01); H01L 23/528 (2013.01);
Abstract

A pattern design for defect inspection, the pattern design including a first floating conductive line; a second floating conductive line; and a grounded conductive line disposed between the first floating conductive line and the second floating conductive line. The first floating conductive line, the second floating conductive line, and the grounded conductive line are divided into a main pad region, a plurality of subregions, a plurality of sub-pad regions, and a ground region. The main pad region is positioned at a first end portion of the pattern design. The ground region is positioned at a second end portion of the pattern design. The plurality of subregions and the plurality of sub-pad regions are positioned between the main pad region and the ground region.


Find Patent Forward Citations

Baek, Jong. (2025). Pattern design for integrated circuits and method for inspecting the pattern design for integrated circuits (U.S. Patent No. 12444661). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12444661

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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