The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Jul. 06, 2023
Applicant:

Sandisk Technologies, Inc., Milpitas, CA (US);

Inventors:

David Rozman, Kiryat-Malakhi, IL;

Ariel Navon, Revava, IL;

Alexander Bazarsky, Holon, IL;

Alon Eyal, Zichron Yaakov, IL;

Assignee:

Sandisk Technologies, Inc., Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 16/34 (2006.01); G11C 16/08 (2006.01); G11C 16/26 (2006.01);
U.S. Cl.
CPC ...
G11C 16/3495 (2013.01); G11C 16/08 (2013.01); G11C 16/26 (2013.01);
Abstract

A data storage device includes a memory device and a controller coupled to the memory device. When a read threshold calibration operation occurs, less than all of the pages of a representative wordline is sensed, such that read thresholds of less than all of the pages of the representative wordline is obtained. The obtained read thresholds and one or more physical conditions of the representative wordline are provided to a model to obtain the other read thresholds of the remaining pages of the representative wordline that were not sensed. The model correlates read thresholds of one page to another page of the same representative wordline and accounts for the one or more physical conditions of the representative wordline.


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