The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2025
Filed:
Aug. 31, 2021
Applicant:
Nec Corporation, Tokyo, JP;
Inventors:
Ryuichi Akashi, Tokyo, JP;
Kosuke Yoshimi, Tokyo, JP;
Yuka Ogino, Tokyo, JP;
Ryo Yamakabe, Tokyo, JP;
Assignee:
NEC CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 40/18 (2022.01); G06F 3/01 (2006.01); G06T 7/20 (2017.01); G06V 10/141 (2022.01);
U.S. Cl.
CPC ...
G06V 40/197 (2022.01); G06F 3/013 (2013.01); G06T 7/20 (2013.01); G06V 10/141 (2022.01); G06V 40/193 (2022.01); G06V 2201/07 (2022.01);
Abstract
An illumination control apparatuscomprises: a detection unitthat detects an iris area IA and a reflection area RA in an eye image IMG_E generated by imaging eyes of a target being illuminated with illumination light IL from an illumination apparatus, the iris area IA and the reflection area RA corresponding to an iris of the eyes and a reflection image of the illumination light respectively; and an illumination control unitthat controls the illumination apparatus based on an overlap state between the iris area and the reflection area.