The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Jun. 30, 2023
Applicant:

Tencent America Llc, Palo Alto, CA (US);

Inventors:

Shan Liu, San Jose, CA (US);

Jun Tian, Belle Mead, NJ (US);

Xiaozhong Xu, State College, PA (US);

Chao Huang, Palo Alto, CA (US);

Xiang Zhang, Sunnyvale, CA (US);

Assignee:

TENCENT AMERICA LLC, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 9/00 (2006.01);
U.S. Cl.
CPC ...
G06T 9/001 (2013.01);
Abstract

Method, apparatus, and system for texture coordinate prediction for mesh compression are provided. The process may include receiving, for a mesh, a coordinate of a first vertex and a coordinate of a prediction candidate vertex in a three dimensional (3D) space. The process may include determining a stretch perpendicular distance associated with the first vertex and the prediction candidate vertex, the stretch perpendicular distance being based on a conversion of the 3D space into a two dimensional (2D) space, and determining a 2D texture coordinate of the first vertex based on the stretch perpendicular distance associated with the first vertex and the prediction candidate vertex. The process may also include determining a residual of a predicted coordinate of the first vertex and an actual 2D coordinate of the first vertex; and compressing the mesh based on entropy coding the residual.


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