The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2025
Filed:
May. 19, 2022
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Cheng-Feng Wang, Kaohsiung, TW;
Li-Che Lin, Kaohsiung, TW;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Abstract
A method of detecting misprints obtains a reference image of perfectly-formed characters and a test image showing the same characters. First image processing is performed on the reference image to obtain a first image, and first image processing is performed on the test image to obtain a second image. A second image processing is performed on the first image to obtain a first outline image of each of first characters in the reference image, and the second image processing is performed on the second image to obtain a second outline image of each of second characters in the test image. A corresponding first outline image is determined for the second outline image. A similarity between the corresponding first outline image and the second outline image is calculated. Accordingly, a detection result of the second outline image is determined. The method can detect character flaw accurately.