The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2025
Filed:
May. 12, 2023
Applicant:
Huawei Cloud Computing Technologies Co., Ltd., Guizhou, CN;
Inventors:
Assignee:
HUAWEI CLOUD COMPUTING TECHNOLOGIES CO., LTD., Guizhou, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06V 10/22 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06V 10/22 (2022.01); G06V 10/82 (2022.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30108 (2013.01);
Abstract
A target region is first extracted from a to-be-recognized image, and then a defect coarse-selection region including an industrial defect is obtained from the target region. Through two times of region extraction, a proportion of a size of the industrial defect to a size of a background is increased, so that a probability of detecting a small-sized industrial defect can be increased. After the defect coarse-selection region including the industrial defect is detected, localization and size estimation are further performed on the industrial defect in the defect coarse-selection region.