The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

May. 24, 2024
Applicant:

Aidash Inc., Palo Alto, CA (US);

Inventors:

Kanishk Varshney, Gurgaon, IN;

Mihir Rajendra Kulkarni, Bangalore, IN;

Shrijit Basak, Bangalore, IN;

Assignee:

AIDash Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 50/08 (2012.01); G06T 7/11 (2017.01); G06V 20/00 (2022.01); G06V 30/19 (2022.01);
U.S. Cl.
CPC ...
G06Q 50/08 (2013.01); G06T 7/11 (2017.01); G06V 20/00 (2022.01); G06V 30/19 (2022.01);
Abstract

An example method includes receiving multiple 360-degree images each of which include a portion of a road. Multiple images based on the multiple 360-degree images are generated. One or more road defect detection models are applied to the multiple images. A first defect in a first portion of the road in a first image and a second defect in a second portion of the road in a second image. A determination that the first defect and the second defect are part of a single defect is made. A first location for the first image and a second location for the second image is received. An estimate of one or more locations of the single defect is made based on the first location and the second location. Defect location data that indicates the one or more locations of the single defect is generated and provided.


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