The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Jul. 19, 2023
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Minwei Feng, Hangzhou, CN;

Yufei Ren, Somers, NY (US);

Yandong Wang, Chicago, IL (US);

Li Zhang, Yorktown Heights, NY (US);

Wei Zhang, Elmsford, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 20/20 (2019.01); G06N 20/00 (2019.01); H04L 67/10 (2022.01);
U.S. Cl.
CPC ...
G06N 20/20 (2019.01); G06N 20/00 (2019.01); H04L 67/10 (2013.01);
Abstract

A machine receives a first set of global parameters from a global parameter server. Multiple learner processors in the machine execute an algorithm that models an entity type using the first set of global parameters and a mini-batch of data known to describe the entity type. The machine generates a consolidated set of gradients that describes a direction for the first set of global parameters in order to improve an accuracy of the algorithm in modeling the entity type when using the first set of global parameters and the mini-batch of data. The machine transmits the consolidated set of gradients to the global parameter server. The machine then receives a second set of global parameters from the global parameter server, where the second set of global parameters is a modification of the first set of global parameters based on the consolidated set of gradients.


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