The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Jan. 30, 2024
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Jaeyeon Park, Suwon-si, KR;

Iljun Ahn, Suwon-si, KR;

Yongsup Park, Suwon-si, KR;

Jaehee Kwak, Suwon-si, KR;

Tammy Lee, Suwon-si, KR;

Minsu Cheon, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 18/22 (2023.01); G06N 3/04 (2023.01); G06T 7/11 (2017.01); G06V 10/40 (2022.01); G06V 10/75 (2022.01);
U.S. Cl.
CPC ...
G06F 18/22 (2023.01); G06N 3/04 (2013.01); G06T 7/11 (2017.01); G06V 10/40 (2022.01); G06V 10/759 (2022.01);
Abstract

Provided are an image processing apparatus and an operation method of the image processing apparatus. The image processing apparatus includes a memory storing one or more instructions, and a processor configured to execute the one or more instructions stored in the memory to, by using one or more convolution neural networks, extract target features by performing a convolution operation between features of target regions having same locations in a plurality of input images and a first kernel set, extract peripheral features by performing a convolution operation of features of peripheral regions located around the target regions in the plurality of input images and a second kernel set, and determine a feature of a region corresponding to the target regions in an output image, based on the target features and the peripheral features.


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