The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Apr. 28, 2025
Applicant:

Institute of Network Technology (Yantai), Shandong, CN;

Inventors:

Haiyang Wang, Yantai, CN;

Zhihua Yu, Yantai, CN;

Qirong Zhou, Yantai, CN;

Qiang Qiu, Yantai, CN;

Jie Chu, Yantai, CN;

Shenqiang Wang, Yantai, CN;

Zhen Zhao, Yantai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/35 (2025.01); G06F 40/117 (2020.01);
U.S. Cl.
CPC ...
G06F 16/35 (2019.01); G06F 40/117 (2020.01);
Abstract

A method, device, and system for extracting and analyzing content facing a large model are provided. The method comprises: by preprocessing a current text generated by the large model, obtaining a plurality of word vectors of the current text, the large model being a machine learning model; by clustering the plurality of word vectors according to an importance degree of the plurality of word vectors, obtaining a plurality of word cluster centers; and determining whether the current text is compliant based on the plurality of word cluster centers and a sensitive word database.


Find Patent Forward Citations

Wang, Haiyang. (2025). Methods, devices, and systems for extracting and analyzing content facing large model (U.S. Patent No. 12443643). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12443643

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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