The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Apr. 11, 2024
Applicant:

Capital One Services, Llc, McLean, VA (US);

Inventors:

Shitij Kulshreshtha, Glen Allen, VA (US);

Rama Mohan Boppana, Glen Allen, VA (US);

Sean Murray, McLean, VA (US);

Jared W. Mcdaniel, McLean, VA (US);

Rahul Babu Mummaneni, McLean, VA (US);

Andrew Seaton, McLean, VA (US);

Rachel Rogers, McLean, VA (US);

Sudeesh Madhusudanan, McLean, VA (US);

Assignee:

Capital One Services, LLC, McLean, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/215 (2019.01); G06F 16/11 (2019.01); G06F 16/23 (2019.01);
U.S. Cl.
CPC ...
G06F 16/215 (2019.01); G06F 16/125 (2019.01); G06F 16/2379 (2019.01);
Abstract

Systems and methods for dynamically evaluating metadata consistency and data reliability in a data management system are disclosed herein. The system may retrieve first metadata and second metadata. The system may retrieve a metadata ruleset. Based on the metadata ruleset, the system may generate a first metadata consistency metric indicating a first measure of consistency. The system may determine to process each record of the first metadata as a batch. The system may generate a second metadata consistency metric indicating a second measure of consistency. The system may determine to process each record of the second metadata independently.


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