The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Jun. 12, 2023
Applicant:

Microsoft Technology Licensing, Llc., Redmond, WA (US);

Inventors:

Aaron Yue-Chiu Chan, Provo, UT (US);

Anant Girish Kharkar, Huntersville, NC (US);

Yevhen Mohylevskyy, Redmond, WA (US);

Kalpathy Sitaraman Sivaraman, Bothell, WA (US);

Neelakantan Sundaresan, Bellevue, WA (US);

Roshanak Zilouchian Moghaddam, Kirkland, WA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/362 (2025.01);
U.S. Cl.
CPC ...
G06F 11/3624 (2013.01);
Abstract

A vulnerability detection and repair system utilize a classifier model to detect a software vulnerability in a source code snippet and the tokens in the source code snippet attributable to the vulnerability. A large language model is then given the vulnerable source code snippet, its vulnerability type, the vulnerability tokens, and a few-shot examples to determine whether or not the source code snippet includes the identified vulnerability. The few-shot examples include positive and negative samples of the type of vulnerability to guide the large language model towards the correct output.


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