The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2025
Filed:
Nov. 29, 2023
Bank of America Corporation, Charlotte, NC (US);
Maharaj Mukherjee, Poughkeepsie, NY (US);
Carl M. Benda, Kannapolis, NC (US);
Suman Roy Choudhury, Berkeley Heights, NJ (US);
Colin Murphy, Charlotte, NC (US);
Elvis Nyamwange, Little Elm, TX (US);
Utkarsh Raj, Charlotte, NC (US);
Vidya Srikanth, Sunnyvale, CA (US);
BANK OF AMERICA CORPORATION, Charlotte, NC (US);
Abstract
Embodiments of the present invention provide a system for analyzing operational parameters of electronic and software components associated with entity applications to detect anomalies. The system is configured for extracting one or more historical images associated with resiliency status of electronic and software components associated with an entity application, analyzing the one or more historical images to generate a pixel wise average of the one or more historical images, generating similarity scores between the one or more historical images, determining a distribution of the similarity scores, receiving a real-time image associated with a current resiliency status of the electronic and software components associated with the entity application, generating a real-time image similarity score for the real-time image, and comparing the real-time image similarity score with the distribution to detect presence of an anomaly.