The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Apr. 05, 2024
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Vinay Sawal, Fremont, CA (US);

Jason Liu, Wellesley, MA (US);

Amihai Savir, Newton, MA (US);

Deepak Krishna, Newcastle, WA (US);

Alice Jiang, Waltham, MA (US);

Jordan Leventis, College Station, TX (US);

Assignee:

DELL PRODUCTS L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G06F 11/07 (2006.01); H04L 67/02 (2022.01);
U.S. Cl.
CPC ...
G06F 11/3006 (2013.01); G06F 11/079 (2013.01); H04L 67/02 (2013.01);
Abstract

Architectures and techniques are described that can generate or receive a dependency graph of a microservices platform. The dependency graph can be constructed based on run time operation of microservices such that the nodes of the graph can represent microservices and the edges can represent the interactions during run time. The dependency graph along with an anomaly pattern can be embedded into an embedding space, and based on an examination of the embedding space, it can be determined whether the anomaly pattern exists in the dependency graph.


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