The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2025
Filed:
Oct. 27, 2021
Dell Products L.p., Round Rock, TX (US);
Ashish A. Pancholi, Cary, NC (US);
Bina K. Thakkar, Cary, NC (US);
David C. Waser, Holly Springs, NC (US);
Dell Products L.P., Round Rock, TX (US);
Abstract
A methods for identifying a multi-tenant storage array for an application workload includes identifying workload parameters and defining a plurality of groups for each parameter and a plurality of 'bins' corresponding to tuples of the groups. Exemplary workload parameters include a percent read parameter and an I/O size parameter. A bin mix of the workload is determined based on historical data wherein the bin mix indicates bins associated with workload activity exceeding a specified threshold. The bin mix is used to define at least some inputs for a supervised learning model of a process for homing application workloads in a multi-tenant storage array. After appropriate training of the model with a generative adversarial network, the model may be invoked to infer or predict attributes of a suitable storage array. The workload may be associated with a scaling factor that influences the determination of a suitable storage array.