The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2025
Filed:
Apr. 29, 2020
Applicant:
Dürr Systems Ag, Bietigheim-Bissingen, DE;
Inventors:
Andreas Gienger, Kirchheim unter Teck, DE;
Oliver Sawodny, Stuttgart, DE;
Simon Alt, Ditzingen, DE;
Martin Weickgenannt, Bietigheim-Bissingen, DE;
Markus Hummel, Urbach, DE;
Tobias Schlotterer, Hechingen, DE;
Jens Berner, Möglingen, DE;
Hauke Bensch, Lübeck, DE;
Assignee:
Dürr Systems AG, Bietigheim-Bissingen, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0254 (2013.01); G05B 2223/02 (2018.08);
Abstract
In order to provide a method for anomaly and/or fault recognition in an industrial-method plant, for example a painting plant, wherein anomalies and/or fault situations are recognisable simply and reliably by means of the method, it is proposed according to the invention that the method should comprise the following: