The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2025
Filed:
Apr. 22, 2025
Zhejiang Normal University, Zhejiang, CN;
Chuankang Li, Jinhua, CN;
Daru Chen, Jinhua, CN;
Yuxian Lu, Jinhua, CN;
Cuifang Kuang, Hangzhou, CN;
ZHEJIANG NORMAL UNIVERSITY, Jinhua, CN;
Abstract
The present disclosure relates to a method and device for removing background noise in microscopic imaging based on frequency-domain modulation. The method includes irradiating a surface of a sample to be measured by simultaneously irradiating the surface of the sample by utilizing two beams from two laser devices. One of the two beams passes through a 0˜2π vortex phase plate and then focuses on the sample to be measured to form a high-energy hollow spot, and the other of the two beams focuses on the sample to be measured to form a low-energy solid spot. The method further includes modulating the two beams in time-domain simultaneously using an electro-optic modulator and demodulating signal light at different frequencies using a lock-in amplifier, then removing the background noise by a differential process to realize a high signal-to-noise ratio super-resolution image.