The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2025
Filed:
Mar. 15, 2021
Applicant:
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Inventor:
Falk Schlaudraff, Butzbach, DE;
Assignee:
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G02B 21/00 (2006.01); G06V 40/12 (2022.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); G02B 21/0004 (2013.01); G06V 40/12 (2022.01); G01N 2035/00821 (2013.01);
Abstract
A device for examining microscope specimens includes a microscope, wherein the microscope specimens include an object to be examined by the microscope and a specimen carrier holding the object, and wherein the device is configured to calculate a digital identification code of the microscope specimen by fingerprinting the microscope specimen using at least one optical marker in at least one digital image of at least a part of the object.