The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2025
Filed:
Aug. 13, 2021
Smiths Detection France S.a.s., Vitry sur Seine, FR;
Serge Maitrejean, Vitry-sur-seine, FR;
SMITHS DETECTION FRANCE S.A.S., Vitry-sur-Seine, FR;
Abstract
A method for determining a flux of inspection radiation is provided, wherein the inspection radiation is emitted by a radiation source and transmitted through cargo, and wherein the flux of inspection radiation is incident on at least one array of detector cells. The detector cells are configured in a first plurality L forming rows of the array, each row of detector cells extending along a direction parallel to a depth direction of the array, the detector cells being further configured in a second plurality λ forming columns of the array, each column of detector cells extending along a direction parallel to a longitudinal direction of the array. The method includes obtaining signal data associated with each detector cell of the array, and determining the flux of the inspection radiation incident on row i, for each row i such as 1≤i≤L, based on the signal data for each detector cell.