The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2025
Filed:
Dec. 26, 2019
Omron Corporation, Kyoto, JP;
Yosuke Kajii, Ayabe, JP;
Tomonori Kondo, Kyoto, JP;
OMRON Corporation, Kyoto, JP;
Abstract
Without requiring that threshold values be set for each measurement condition, the present invention makes it possible to determine whether noise that can occur in measured values is present. An optical measurement device acquires measured values on the basis of the amount of reflected light that is received after being reflected by a target. The optical measurement device comprises a setting part for setting a threshold value for the amount of received reflected light per unit time on the basis of feature information regarding the light amount of the optical measurement device and a determination part for determining whether there is measured value noise on the basis of the threshold value.